Electromagnetic Compatibility of Integrated Circuits

Author: Sonia Ben Dhia
Edition: 2006
Binding: Kindle Edition
ISBN: B000WD7RZQ

Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility

Electromagnetic Compatibility of Integrated Circuits: Techniques for Low Emission and Susceptibility focusesAon the electromagnetic compatibility of integrated circuits. Download Electromagnetic Compatibility of Integrated Circuits: Techniques for low emission and susceptibility from rapidshare, mediafire, 4shared. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines Search and find a lot of engineering books in many category availabe for free download.

Electromagnetic Compatibility of Integrated Circuits Free

Download Electromagnetic Compatibility of Integrated Circuits engineering books for free. The basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations he basic concepts, theory, and an extensive historical review of integrated circuit emission and susceptibility are provided. Standardized measurement methods are detailed through various case studies. EMC models for the core, I/Os, supply network, and packaging are described with applications to conducted switching noise, signal integrity, near-field and radiated noise. Case studies from different companies and research laboratories are presented with in-depth descriptions of the ICs, test set-ups, and comparisons between measurements and simulations. Specific guidelines

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